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Appearance Inspection Requirements for Integrated Circuit (CHI - ENG) 我们为某国家级实验室提供技术类翻译(中译英),翻译内容:集成电路外观检查要求。
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4.4  外观检查过程器件的防护要求
a) 外观检查过程中必须采取防静电措施。
b) 接触器件时必须佩带指套。
c) 外观检查过程中不得改变器件原包装。器件检查完毕后包装应恢复到初始状态,并注意上、下包装的标志方向。
d) 外观检查过程中要轻拿轻放,防止器件跌落、碰伤、划伤或晃动磨损。
4.4  Protection requirements for devices during appearance inspection
a) Anti-static measures must be taken during appearance inspection.
b) Fingerstall must be worn when touching the devices.
c) The original package of devices must not be changed during appearance inspection. After the completion of the device inspection, the package shall be restored to its original state, and the direction of signs of upper and lower packaging shall be noticed.
d) Handle devices gently during appearance inspection, and prevent the fall, bruise, scratch, shake or wear of devices.
 
4.5  外观检查环境条件
除非另有规定,应在进行外观检查的试验室环境应满足以下条件:温度:20℃~28℃,相对湿度:30%~70%。
4.5 Environmental conditions for appearance inspection
Unless otherwise specified, the laboratory environment for appearance inspection shall meet the following conditions: Temperature: 20 °C to 28 °C, relative humidity: 30% to 70%.
 
4.6试验实施
4.6  Test implementation
 
4.6.1器件包装检查
检查器件的包装是否为正确的包装,包装盒的方向是否正确。确认包装完好并正确包装后,接受器件外观检查工作。
4.6.1 Device packaging inspection
Inspect whether the packaging of devices and the direction of packing box are correct. After confirming that the package is intact and proper, appearance inspection of devices can be started.
4.6.2核对待外观检查器件
按照器件包装标志的方向,在操作台上打开包装。核对待外观检查的器件,确认器件的型号、批号、数量与工序表一致。
4.6.2 Check the device to undergo appearance inspection
Open the package on the operating platform according to the direction of the device’s package sign. Check the device whose appearance is to be inspected and confirm that the model, lot number and quantity of the device are consistent with the operation list.
4.6.3外观检查
在到货检验专用工作台上,每次取出1只器件在光学显微镜下进行外观检查。若出现失效判据(见第4节)中的情况,则判器件为外观检查不合格品。发现器件外观异常或多只器件外观不合格时,填写筛选问题报告。
4.6.3 Appearance inspection
On the special operating platform for arrival inspection, one device is taken out for appearance inspection under the optical microscope each time. In the event of a failure judgment (see Section 4), then the device is judged to be a non-conforming product in appearance inspection. When finding that the appearance of one device is abnormal or that of multiple devices is defective, fill out the screening problem report.

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