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The purpose of this document is to provide guidance to space flight programs and technology developers for radiation testing and qualification of nonvolatile memories (NVMs), with emphasis on modern flash memory devices. This document assumes a basic knowledge of radiation effects and of the space radiation environment on the part of the reader.
本文档旨在为太空飞行项目和技术开发人员提供关于非易失性存储器（NVM）的辐射测试和资格认证的指导，重点关注现代闪存存储器设备。本文假定读者具有辐射效应和太空辐射环境的基本知识。

Decades ago, spacecraft NVM often meant a tape recorder. Solid state devices became more common, due to the increased reliability from not containing any moving part. This is an important advantage over many alternatives. However, solid state devices have other reliability issues, particularly when exposed to the space radiation environment.
几十年前，航天器NVM通常指的是磁带记录器。后来固态器件变得更加普遍，因为其不含任何移动部件而具有更高的可靠性。这是相对于许多替代方案所呈现出的重要优势。然而，固态器件在暴露于太空辐射环境时存在其他可靠性问题。

Nonvolatile memories onboard spacecraft systems must operate in a radiation environment consisting of electrons and ions that span the entire periodic table. Exposure to those ions may cause significant damage to critical components and compromise the mission’s success. The actual particle fluxes will vary widely, depending on the spacecraft orbit, solar activity and shielding.
太空航天系统上的非易失性存储器必须在包含整个周期表的电子和离子的辐射环境中运行。暴露于这些离子可能会对关键部件造成重大损坏，并危及任务的成功。实际的粒子通量会因太空航天器轨道、太阳活动和屏蔽情况而大不相同。

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