根据XXX委托，YYY对XXX生产ZZZ型X辐照加固微处理器制定了单粒子效应试验方案。依据试验方案，采用XXXZZZ电路单粒子效应检测系统，并利用兰州近代物理研究所回旋加速器的Bi离子和中国原子能科学研究院HI-13串列静电加速器的O、Si、Cl、Ge离子，进行了ZZZ单粒子效应鉴定试验。
As entrusted by XXX, YYY develops the SEE test plan for ZZZ radiation-hardened X microprocessor manufactured by XXX. Based on the test plan, the YYY conducts SEE qualification test to ZZZ by adopting ZZZ circuit SEE detecting system of XXX and using Bi ion of cyclotron of Institute of Modern Physics, CAS and O, Si, Cl, Ge ions of HI-13 tandem electrostatic accelerator of China Institute of Atomic Energy.
本试验采用ZZZ处理器的系统验证板来进行单粒子试验，试验板上包括被测单元模块、PC机主控单元模块、程序存储单元、通信单元等，被测单元包含被测处理器，主要是被测处理器运行训练程序平台进行功能测试，包括对整数单元（IU）、浮点单元（FPU）、高速二级缓存单元（CACHE）和寄存器文件单元（REGFILE）的单粒子测试。
The SEE test is carried out by adopting the system validation board of ZZZ processor. There is test unit module, MCU module of PC, program storage units and communication units, etc. on the test board. Test units include test processor, and the functional tests (including SEE test of integer unit (IU), floating-point unit (FPU), L2 cache unit (CACHE) and registration file unit (REGFILE)) are mainly done by the test processor through operating the training program platform.
根据XXX检测系统测得的地面单粒子试验数据，得到器件Cache 区单粒子翻转饱和截面为xE-3cm2/器件，LET阈值为xMeV.cm2/mg（x%饱和截面），如图3所示。计算出GEO轨道（xkm/0°）器件Cache 区的单粒子翻转率为xE-1次/器件.天（Adams x%最坏情况，xmm等效Al屏蔽）。
According to the ground SEE test data obtained by the detecting system of XXX, the SEU saturated cross section of device in the Cache zone is xE-3cm2/device and the LET threshold value is xMeV.cm2/mg (x% saturated cross section), as shown in Fig. 3. SEU rate of device in the Cache zone on the GEO orbit (xkm/0°) is calculated to be xE-1 times/device•day (Adamsx% worst case, xmm equivalent Al shielding).

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