译文摘录（保密内容以XXX替代）：
 
引言
Introduction
 
卫星、飞船运行于轨道空间， 不可避免地遭遇各种带电粒子的辐射， 空间带电粒子通过与星上电子元器件相互作用产生辐射效应， 对卫星造成不同程度的损伤， 威胁卫星安全运行。
Satellites and spacecraft operating in the orbit of space will inevitably suffer from radiation emitted by various kinds of charged particles. Afterwards, these parties in space and electronic components in the satellites will interact with each other to produce the radiation effect, which will cause damage to the satellites to varying degrees and threaten their safe operation.
 
微电子器件受空间辐射引起的单粒子翻转（SEU）、单粒子锁定（SEL）或单粒子烧毁（SEB）等统称为单粒子效应，它是威胁卫星及各种航天器在轨正常运行和寿命的重要因素之一。
Single Event Upset (SEU), Single Event Latchup (SEL) or Single Event Burnout (SEB), arising from the microelectronic devices being exposed to space radiation, are collectively referred to as the single event effect (SEE). SEE is among the crucial factors threatening the in-orbit normal operation and service life of satellites and different types of spacecraft.
 
元器件在用于卫星型号之前，必须在地面用高能质子或重离子加速器产生的高能质子或重离子模拟空间辐射环境，测量其抗单粒子翻转、单粒子锁定、 单粒子烧毁能力和出现这些效应的截面，以判断其是否达到了所需的抗辐射性能指标。器件单粒子效应评估结果与单粒子效应测试方法有关。本文建立了一种SRAM单粒子效应测试方法，可较好的区分SRAM内部各功能单元的单粒子效应敏感性。
Before applying a component to one type of satellite, high-energy protons or heavy ions generated from high-energy proton or heavy ion accelerators must be used on the ground to simulate the space radiation environment. The aim is to measure its ability to resist SEU, SEL and SEB, and the sections where these effects occur, in a move to judge whether the component has reached the required anti-radiation performance indicator. The result of evaluating the single event effect in a component is related with the SEE testing method. Given that, this paper creates a SRAM-based SEE testing method which will prove effective in differentiating between the internal functions units of SRAM in their sensitivity to SEE.